| Patents : |
| 1. Mostafa Agour; Khaled Elshaffey; Claas Falldorf; Christoph von Kopylow; Ralf B. Bergmann. Method for measuring optical wave field for examining test specimen e.g. lenses, involves determining amplitude and phase of optical wave field of measuring plane from intensity distributions obtained by image sensor in detection plane. DE 102013209461 B3 |
| 2. Muta Osamu; Mahmoud Ehab Mahmoud; Furukawa Hiroshi. Wireless Communication System, Transmitter, Propagation Path Characteristic Estimating Apparatus, Propagation Path Characteristic Estimating Method and Program. JP WO/2011/155569 |
| 3. Mohamed Orabi; Gaber Abukahok; Mohamed Saed. Power Startup and Conditioning Method for Photovoltaic Controllers and Systems. Pending 2012, Egyptian Patent Office |
| 4. Ahmed Thabet Mohamed. Nano-Metric Power Capacitors. Pending 2011-988, Egyptian Patent Office |
| 5. Ahmed Thabet Mohamed. Nano-Metric Insulations for Electric Power Cabels. Pending 2011-989, Egyptian Patent Office |
